Origins of nanoscale heterogeneity in ultrathin films.

Academic Article

Abstract

  • A key challenge in thin-film growth is controlling structure and composition at the atomic scale. We have used spatially resolved electron scattering to measure how the three-dimensional composition profile of an alloy film evolves with time at the nanometer length scale. We show that heterogeneity during the growth of Pd on Cu(001) arises naturally from a generic step-overgrowth mechanism relevant in many growth systems.
  • Authors

  • Hannon, JB
  • Sun, J
  • Pohl, Karsten
  • Kellogg, GL
  • Status

    Publication Date

  • June 23, 2006
  • Has Subject Area

    Published In

    Digital Object Identifier (doi)

    Pubmed Id

  • 16907257
  • Start Page

  • 246103
  • Volume

  • 96
  • Issue

  • 24