The X-ray Polarization Probe (XPP) is a second generation X-ray polarimeter
following up on the Imaging X-ray Polarimetry Explorer (IXPE). The XPP will
offer true broadband polarimetery over the wide 0.2-60 keV bandpass in addition
to imaging polarimetry from 2-8 keV. The extended energy bandpass and
improvements in sensitivity will enable the simultaneous measurement of the
polarization of several emission components. These measurements will give
qualitatively new information about how compact objects work, and will probe
fundamental physics, i.e. strong-field quantum electrodynamics and strong
gravity.
