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Journal of Physics: Condensed Matter
Journal
Overview
Identity
Overview
Publication Venue For
Defect identification and statistics toolbox: automated defect analysis for scanning probe microscopy images.
. 33:045901-045901.
2020
Native defects in ultra-high vacuum grown graphene islands on Cu(1 1 1).
. 28:034003.
2016
Has Subject Area
Fluids & Plasmas
Identity
International Standard Serial Number (issn)
0953-8984
Electronic International Standard Serial Number (eissn)
1361-648X
